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ASML TWINSCAN XT:1400F
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    OEM 모델 설명
    The TWINSCAN XT:1400F is a dual-stage ArF lithography system designed for 200-mm and 300-mm wafers at 65-nm resolution. It employs a 0.65-0.93 NA Carl Zeiss lens and AERIAL E Illuminator, pushing ArF technology beyond 65-nm. Its dual wafer-stage enables simultaneous exposure and alignment, maximizing productivity. The system ensures comprehensive focus control, especially on edge dies, and with its 45-W ArF laser, achieves a throughput of 133 300-mm wph and 165 200-mm wph efficiently. Designed for extreme low-k1 operations, it enhances process precision and offers built-in metrology for advanced process tracking.
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    ASML

    TWINSCAN XT:1400F

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    검증됨

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    Steppers & Scanners

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

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    제품 ID:

    90829


    웨이퍼 사이즈:

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    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    ASML TWINSCAN XT:1400F

    ASML

    TWINSCAN XT:1400F

    Steppers & Scanners
    빈티지: 0조건: 중고
    마지막 검증일60일 이상 전

    ASML

    TWINSCAN XT:1400F

    verified-listing-icon
    검증됨
    카테고리
    Steppers & Scanners
    마지막 검증일: 60일 이상 전
    listing-photo-427468ab149444cb820c0976783a84ec-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    90829


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The TWINSCAN XT:1400F is a dual-stage ArF lithography system designed for 200-mm and 300-mm wafers at 65-nm resolution. It employs a 0.65-0.93 NA Carl Zeiss lens and AERIAL E Illuminator, pushing ArF technology beyond 65-nm. Its dual wafer-stage enables simultaneous exposure and alignment, maximizing productivity. The system ensures comprehensive focus control, especially on edge dies, and with its 45-W ArF laser, achieves a throughput of 133 300-mm wph and 165 200-mm wph efficiently. Designed for extreme low-k1 operations, it enhances process precision and offers built-in metrology for advanced process tracking.
    문서

    문서 없음

    유사 등재물
    모두 보기
    ASML TWINSCAN XT:1400F

    ASML

    TWINSCAN XT:1400F

    Steppers & Scanners빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    ASML TWINSCAN XT:1400F

    ASML

    TWINSCAN XT:1400F

    Steppers & Scanners빈티지: 0조건: 중고마지막 검증일:60일 이상 전