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설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.문서
문서 없음
JEOL
JEM-3010
카테고리
TEM
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
69539
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
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설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.문서
문서 없음