설명
FEI Tecnai G2 F30 TWIN 300kV FEG TEM환경 설정
– FEI Tecnai G2 F30 TWIN 300 kV FEG Transmission Electron Microscope – Suitable for materials science, nanomaterials, and life sciences ** BEAM ** – Field emission gun (FEG) – Acceleration voltage: 300 kV ** RESOLUTION ** – Point resolution: 0.24 nm – Line resolution: 0.14 nm ** DETECTORS ** – Gatan UltraScan 4000 UHS MP (multi-port readout) for 300 kV ** STAGE ** – Single-tilt holder – Single-tilt tomography holder – Double-tilt holder – Five-axis motorized goniometer stage – Typical tilt range up to ±70 degrees with tomography holderOEM 모델 설명
미제공문서
문서 없음
TECNAI
F20
카테고리
TEM
마지막 검증일: 12일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
147194
웨이퍼 사이즈:
알 수 없음
빈티지:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
FEI Tecnai G2 F30 TWIN 300kV FEG TEM환경 설정
– FEI Tecnai G2 F30 TWIN 300 kV FEG Transmission Electron Microscope – Suitable for materials science, nanomaterials, and life sciences ** BEAM ** – Field emission gun (FEG) – Acceleration voltage: 300 kV ** RESOLUTION ** – Point resolution: 0.24 nm – Line resolution: 0.14 nm ** DETECTORS ** – Gatan UltraScan 4000 UHS MP (multi-port readout) for 300 kV ** STAGE ** – Single-tilt holder – Single-tilt tomography holder – Double-tilt holder – Five-axis motorized goniometer stage – Typical tilt range up to ±70 degrees with tomography holderOEM 모델 설명
미제공문서
문서 없음