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KLA / ADE ULTRAGAGE 9500
  • KLA / ADE ULTRAGAGE 9500
  • KLA / ADE ULTRAGAGE 9500
  • KLA / ADE ULTRAGAGE 9500
설명
With ASC2000 controller
환경 설정
환경 설정 없음
OEM 모델 설명
The ADE 9500 UltraGage is a benchmark in wafer geometry characterization, essential in device fabrication and silicon wafer manufacturing. It accurately measures thickness, flatness, bow/warp, and more, using noncontact methods with 10nm resolution, applicable to both patterned and polished wafers. This compact tool offers nondestructive control, with options for manual or cassette operation, and supports optional networking including SECS/GEM. Ideal for applications in photolithography, CMP, and other processes, the UltraGage is a versatile, high-performance metrology solution.
문서

문서 없음

PREFERRED
 
SELLER
카테고리
Thin Film / Film Thickness

마지막 검증일: 23일 전

Buyer pays 12% premium of final sale price
주요 품목 세부 정보

조건:

Refurbished


작동 상태:

알 수 없음


제품 ID:

124770


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

KLA / ADE

ULTRAGAGE 9500

verified-listing-icon
검증됨
카테고리
Thin Film / Film Thickness
마지막 검증일: 23일 전
listing-photo-1b70db51bb6a49258c790d4b7991c277-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Buyer pays 12% premium of final sale price
주요 품목 세부 정보

조건:

Refurbished


작동 상태:

알 수 없음


제품 ID:

124770


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
With ASC2000 controller
환경 설정
환경 설정 없음
OEM 모델 설명
The ADE 9500 UltraGage is a benchmark in wafer geometry characterization, essential in device fabrication and silicon wafer manufacturing. It accurately measures thickness, flatness, bow/warp, and more, using noncontact methods with 10nm resolution, applicable to both patterned and polished wafers. This compact tool offers nondestructive control, with options for manual or cassette operation, and supports optional networking including SECS/GEM. Ideal for applications in photolithography, CMP, and other processes, the UltraGage is a versatile, high-performance metrology solution.
문서

문서 없음