메인 콘텐츠로 건너뛰기
We value your privacy

We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 더 알아보기

Moov logo

Moov Icon
ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000
설명
설명 없음
환경 설정
Film Thickness Measurement System
OEM 모델 설명
The NanoSpec 8000 is a fully automated film thickness measurement system introduced by Nanometrics. It is designed to meet the speed, measurement, performance, and reliability requirements essential to high-level factory control in today’s semiconductor mega-fabs and magnetic head production. The system can be programmed to run operator-free and offers a wide range of film thickness measurements for 75 mm to 200 mm wafers. Additionally, it boasts a low cost of ownership.
문서

문서 없음

카테고리
Thin Film / Film Thickness

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

117081


웨이퍼 사이즈:

알 수 없음


빈티지:

1996


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ONTO / NANOMETRICS / ACCENT / BIO-RAD

NANOSPEC 8000

verified-listing-icon
검증됨
카테고리
Thin Film / Film Thickness
마지막 검증일: 60일 이상 전
listing-photo-b3e240a9aca44328bda7a8b3668d6ab8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

117081


웨이퍼 사이즈:

알 수 없음


빈티지:

1996


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음
환경 설정
Film Thickness Measurement System
OEM 모델 설명
The NanoSpec 8000 is a fully automated film thickness measurement system introduced by Nanometrics. It is designed to meet the speed, measurement, performance, and reliability requirements essential to high-level factory control in today’s semiconductor mega-fabs and magnetic head production. The system can be programmed to run operator-free and offers a wide range of film thickness measurements for 75 mm to 200 mm wafers. Additionally, it boasts a low cost of ownership.
문서

문서 없음