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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000X
  • ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000X
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OEM 모델 설명
The NanoSpec 8000X is a versatile tool designed for the automated measurement of wafers ranging in size from 75mm to 200mm. It comes with a standard mechanical interface and can be equipped with mini-environment enclosures, making it suitable for use in ultra-clean manufacturing facilities. Additionally, the 8000X can be configured to handle substrates used in the magnetic recording head industry. With these features, the NanoSpec 8000X is a reliable and adaptable solution for a variety of wafer measurement needs.
문서
카테고리
Thin Film / Film Thickness

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

89432


웨이퍼 사이즈:

4"/100mm


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ONTO / NANOMETRICS / ACCENT / BIO-RAD

NANOSPEC 8000X

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검증됨
카테고리
Thin Film / Film Thickness
마지막 검증일: 60일 이상 전
listing-photo-18f41c290f5d4a638adc65e8cca82b4a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/46368/89432/edc400f4219545d4ba8a8633161e03bb_96bc651590584aa78582a94bc6c7250a609519ec64414d1781e7d420fab886a3_mw.jpg
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

89432


웨이퍼 사이즈:

4"/100mm


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음
환경 설정
환경 설정 없음
OEM 모델 설명
The NanoSpec 8000X is a versatile tool designed for the automated measurement of wafers ranging in size from 75mm to 200mm. It comes with a standard mechanical interface and can be equipped with mini-environment enclosures, making it suitable for use in ultra-clean manufacturing facilities. Additionally, the 8000X can be configured to handle substrates used in the magnetic recording head industry. With these features, the NanoSpec 8000X is a reliable and adaptable solution for a variety of wafer measurement needs.
문서