설명
METROLOGY환경 설정
8300 XSEOEM 모델 설명
The NanoSpec 8300 is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today.문서
문서 없음
카테고리
Thin Film / Film Thickness
마지막 검증일: 17일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
149426
웨이퍼 사이즈:
8"/200mm, 12"/300mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8300
카테고리
Thin Film / Film Thickness
마지막 검증일: 17일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
149426
웨이퍼 사이즈:
8"/200mm, 12"/300mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
METROLOGY환경 설정
8300 XSEOEM 모델 설명
The NanoSpec 8300 is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today.문서
문서 없음