설명
CD OPTICAL MEASUREMENT, CU환경 설정
환경 설정 없음OEM 모델 설명
The Opti-Probe 7341 is a thin-film and critical dimension (CD) metrology tool that is part of Therma-Wave’s Opti-Probe line of thin-film measurement tools. It delivers a metrology solution for high-volume 65nm chip production to semiconductor manufacturers, yielding better precision and productivity than earlier generation tools. Comprehensive field data for the Opti-Probe-7341 demonstrates an improvement in performance for its customers’ most critical thin-film and optical CD applications by a factor of up to two times.문서
문서 없음
KLA / THERMA-WAVE
OP-7341
검증됨
카테고리
Thin Film / Film Thickness
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
92886
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / THERMA-WAVE
OP-7341
카테고리
Thin Film / Film Thickness
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
92886
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
CD OPTICAL MEASUREMENT, CU환경 설정
환경 설정 없음OEM 모델 설명
The Opti-Probe 7341 is a thin-film and critical dimension (CD) metrology tool that is part of Therma-Wave’s Opti-Probe line of thin-film measurement tools. It delivers a metrology solution for high-volume 65nm chip production to semiconductor manufacturers, yielding better precision and productivity than earlier generation tools. Comprehensive field data for the Opti-Probe-7341 demonstrates an improvement in performance for its customers’ most critical thin-film and optical CD applications by a factor of up to two times.문서
문서 없음