설명
N&K 5700 CDRT Metrology system Broadband spectrometry for film thickness and trench profile measurements on photomask reticles.환경 설정
Working potsize: R = 50um, T < 400um The n&k 5700-CDRT automated system is designed for handling 5” or 6” square masks. The n&k 5700-CDRT simultaneously determines thickness, n and k in the spectral range of 190-1000nm, and trench profile. These systems provide non-destructive, real time, high throughput measurements directly on the device and collect polarized reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point. These systems encompass advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system. This system includes a polarizer and special trench analysis software and provides non-destructive, real-time measurements of CD, trench depth, and profile.OEM 모델 설명
미제공문서
문서 없음
N & K
5700 CDRT
검증됨
카테고리
Thin Film / Film Thickness
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
66006
웨이퍼 사이즈:
알 수 없음
빈티지:
2006
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
N & K
5700 CDRT
카테고리
Thin Film / Film Thickness
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
66006
웨이퍼 사이즈:
알 수 없음
빈티지:
2006
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
N&K 5700 CDRT Metrology system Broadband spectrometry for film thickness and trench profile measurements on photomask reticles.환경 설정
Working potsize: R = 50um, T < 400um The n&k 5700-CDRT automated system is designed for handling 5” or 6” square masks. The n&k 5700-CDRT simultaneously determines thickness, n and k in the spectral range of 190-1000nm, and trench profile. These systems provide non-destructive, real time, high throughput measurements directly on the device and collect polarized reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point. These systems encompass advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system. This system includes a polarizer and special trench analysis software and provides non-destructive, real-time measurements of CD, trench depth, and profile.OEM 모델 설명
미제공문서
문서 없음