설명
Surface Charge Analyzer환경 설정
환경 설정 없음OEM 모델 설명
Semilab SDI CnCV 230 tool for non-contact C-V characterisation of wide bandgap semiconductors. In response to broadening interest from the wide bandgap community, our team at Semilab SDI, based in Tampa, FL, has introduced the CnCV 200 series of tools. Its capabilities include dopant concentration profiling of GaN and SiC, measuring the two-dimensional electron-gas sheet charge in an AlGaN/GaN HEMT, and characterisation of interfaces between dielectrics and wide bandgap semiconductors문서
문서 없음
SEMITOOL
CnCV 230
카테고리
Thin Film / Film Thickness
마지막 검증일: 22일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
142961
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Surface Charge Analyzer환경 설정
환경 설정 없음OEM 모델 설명
Semilab SDI CnCV 230 tool for non-contact C-V characterisation of wide bandgap semiconductors. In response to broadening interest from the wide bandgap community, our team at Semilab SDI, based in Tampa, FL, has introduced the CnCV 200 series of tools. Its capabilities include dopant concentration profiling of GaN and SiC, measuring the two-dimensional electron-gas sheet charge in an AlGaN/GaN HEMT, and characterisation of interfaces between dielectrics and wide bandgap semiconductors문서
문서 없음