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KLA / THERMA-WAVE OP-7341
    설명
    CD OPTICAL MEASUREMENT, CU
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Opti-Probe 7341 is a thin-film and critical dimension (CD) metrology tool that is part of Therma-Wave’s Opti-Probe line of thin-film measurement tools. It delivers a metrology solution for high-volume 65nm chip production to semiconductor manufacturers, yielding better precision and productivity than earlier generation tools. Comprehensive field data for the Opti-Probe-7341 demonstrates an improvement in performance for its customers’ most critical thin-film and optical CD applications by a factor of up to two times.
    문서

    문서 없음

    KLA / THERMA-WAVE

    OP-7341

    verified-listing-icon

    검증됨

    카테고리
    Thin Film

    마지막 검증일: 30일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    92886


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA / THERMA-WAVE OP-7341

    KLA / THERMA-WAVE

    OP-7341

    Thin Film
    빈티지: 0조건: 중고
    마지막 검증일30일 이상 전

    KLA / THERMA-WAVE

    OP-7341

    verified-listing-icon
    검증됨
    카테고리
    Thin Film
    마지막 검증일: 30일 이상 전
    listing-photo-f5111f174f564d7a91ab6fc90788a824-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    92886


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    CD OPTICAL MEASUREMENT, CU
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Opti-Probe 7341 is a thin-film and critical dimension (CD) metrology tool that is part of Therma-Wave’s Opti-Probe line of thin-film measurement tools. It delivers a metrology solution for high-volume 65nm chip production to semiconductor manufacturers, yielding better precision and productivity than earlier generation tools. Comprehensive field data for the Opti-Probe-7341 demonstrates an improvement in performance for its customers’ most critical thin-film and optical CD applications by a factor of up to two times.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA / THERMA-WAVE OP-7341

    KLA / THERMA-WAVE

    OP-7341

    Thin Film빈티지: 0조건: 중고마지막 검증일:30일 이상 전