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Röntgendiffraktometer zur Messung hochauflösender Röntgenbeugung und Röntgenreflektion mit CU-KA Anode für 6" und 8" Wafer X-Ray Diffractometer for measuring high resolution X-ray Diffraction and Reflection applications with a Cu-kA Anode for 6 and 8 inch wafers Still in production. Ready for inspection.OEM 모델 설명
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.문서
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BRUKER
D8 FABLINE
검증됨
카테고리
X-Ray
주요 품목 세부 정보
조건:
알 수 없음
작동 상태:
알 수 없음
제품 ID:
16327
웨이퍼 사이즈:
8"/200mm
빈티지:
2011
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
BRUKER
D8 FABLINE
검증됨
카테고리
X-Ray
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
알 수 없음
작동 상태:
알 수 없음
제품 ID:
16327
웨이퍼 사이즈:
8"/200mm
빈티지:
2011
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
Röntgendiffraktometer zur Messung hochauflösender Röntgenbeugung und Röntgenreflektion mit CU-KA Anode für 6" und 8" Wafer X-Ray Diffractometer for measuring high resolution X-ray Diffraction and Reflection applications with a Cu-kA Anode for 6 and 8 inch wafers Still in production. Ready for inspection.OEM 모델 설명
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.문서
문서 없음