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설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The electron optical system of the Model S-9260 CD-SEM has a 3-nm image resolution, which is applicable to lines/spaces and hole patterns of less than 0.1 µm. Figs. 2 and 3 show examples of observations of the model. It has formula-editor and beam-tilt observation functions that enable detecting process variations early and controlling them easily.문서
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주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
126299
웨이퍼 사이즈:
알 수 없음
빈티지:
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Transaction Insured by Moov
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Refurbishment Services
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PREFERRED
SELLER
HITACHI
S-9260A
카테고리
CD-SEM
마지막 검증일: 9일 전
Buyer pays 12% premium of final sale price
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
126299
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The electron optical system of the Model S-9260 CD-SEM has a 3-nm image resolution, which is applicable to lines/spaces and hole patterns of less than 0.1 µm. Figs. 2 and 3 show examples of observations of the model. It has formula-editor and beam-tilt observation functions that enable detecting process variations early and controlling them easily.문서
문서 없음