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TEL / TOKYO ELECTRON LITHIUS Pro V
    설명
    Multi Block Resist Coater/Developer
    환경 설정
    · 4 Blocks: 1 Carrier, 2 Multi-purpose, 1 Process · 6 (250 WPH) Transfer Robot arms: 1 Carrier, 2 Multi-purpose, 3 Process · Stainless Exhaust Lines below Track · SECS1, SECS11, HMDS & GEM Interface required is iUSC · E87/GJG compliance · 2 Piece Wafer Block · Stack 1: No Process Modules – only HMDS Bubblers · Stack 2: No Process Modules – only HMDS Bubblers · Stack 3: 12 CADH modules (no spin modules) · Stack 4: 3 BCT Cups with 10 Nozzles · Stack 5: 3 BCT Cups with 10 Nozzles · AC Power Box with Noise filter: CE Mark Type · AC Power Box 208volts, 3-phase, star, 50/60Hz compatible, SCCR requirements Cassette Block (CSB) · (5) FOUP Loadports (with N2 purge Pre-plumbing) · Carrier RFID capability on CSB · CSB Pressure Sensor Main Block with 5 Process Stacks · Stack 1 & 2 No Process Modules or Robotic Arms o 12 HMDS Bubbler System · Stack 3 HMDS Processing Only o 1 Process Robotic Arm · Stack 4 BARC Processing o (4) BCT Modules with TCT style cups and backside rinse nozzles o (10) 1.2 mm Resist nozzles, (1) SRRC nozzle with Temp control per layer o (10) 0.8 mm Resist nozzles, (1) ARRC nozzle with Temp control per layer o (10) 3ml CRD resist dispense pumps o (10) 3ml ACRD resist dispense pumps o (10) Single Bottle Resist Supply Configuration o EBR angle adjustment capability o Bulk-FSI system for solvent dispense o Exhaust Pressure Control (EPC) per stack o Exhaust duct and drain case cleaning function o Exhaust Thermo Controller System in STHC o 4 Dispense Detection Systems (all COT modules) o Bevel Rinse nozzle (Ver 2) o IFF-S for RRC lines with ARRC-s o IFF-R (for Resist) · Stack 5 BARC Processing o (4) BCT Modules with TCT style cups and backside rinse nozzles o (10) 1.2 mm Resist nozzles, (1) SRRC nozzle with Temp control per layer o (10) 0.8 mm Resist nozzles, (1) ARRC nozzle with Temp control per layer o (10) 3ml CRD resist dispense pumps o (10) 3ml ACRD resist dispense pumps o (10) Single Bottle Resist Supply Configuration o EBR angle adjustment capability o Bulk-FSI system for solvent dispense o Exhaust Pressure Control (EPC) per stack o Exhaust duct and drain case cleaning function o Exhaust Thermo Controller System in STHC o 4 Dispense Detection Systems (all COT modules) o Bevel Rinse nozzle (Ver 2) o IFF-S for RRC lines with ARRC-s o IFF-R (for Resist) · (12) Chilling Adhesion Processing Station (CADH) o Wafer Wedging function using Plate Temperature sensor SW calculation o (2) Bubbler Type HMDS Tank located in Main processing block o Gap Pin type UPIMOL proximity pins on chilling arm · (6) Slim Chill Plate Process Station (SCPL) o Wafer wedging function using vacuum detection sensor o Gap Pin type UPIMOL proximity pins on chilling arm · (2) Chilling High Precision Hot Plate Process Station (CHCH) o Heated Exhaust Chamber o Wafer Wedging function using Plate Temperature sensor SW o Gap Pin type ceramic proximity pins on chilling arm · (14) General Purpose Hot Plate Process Station (CGCH) o Heated Exhaust Chamber o Wafer Wedging function using Plate Temperature sensor SW o Gap Pin type UPIMOL proximity pins on chilling arm · (1) TEL System Temp and Humidity Controller (STHC) o (1) Shinwa unit for system environment control, chemical temperature control and CPL temperature control o (1) Return Air Box - Plenum · (2) New Style Chemical Cabinets o (1) HMDS Canister (3 gallons with gauge) o (1) 3-Pump Solvent chemical supply system o (1) 2-Pump Developer chemical supply system o (1) Sub operation panel o Top side facility connection o CRF for solvent based PCS · (1) New Style AC Power Box o Dual Feed facility supply power with 2 separate breakers o Top side facility connection o Ring type GND connection
    OEM 모델 설명
    CLEAN TRACK™ LITHIUS Pro™ V incorporates all of the advanced technology of the proven CLEAN TRACK™ LITHIUS Pro™ V. It enables higher throughput, increases wafers per day, and improves overall equipment efficiency. Additionally, it also meets industry requirements for versatile lithography equipment capable of leading edge processes, including double patterning.
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    검증됨

    카테고리
    Coaters & Developers

    마지막 검증일: 어제

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    155143


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    알 수 없음


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    TEL / TOKYO ELECTRON LITHIUS Pro V

    TEL / TOKYO ELECTRON

    LITHIUS Pro V

    Coaters & Developers
    빈티지: 0조건: 중고
    마지막 검증일어제

    TEL / TOKYO ELECTRON

    LITHIUS Pro V

    verified-listing-icon
    검증됨
    카테고리
    Coaters & Developers
    마지막 검증일: 어제
    listing-photo-47d4b142b8f04c38ad20b785c9f9dcd3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    155143


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    알 수 없음


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Multi Block Resist Coater/Developer
    환경 설정
    · 4 Blocks: 1 Carrier, 2 Multi-purpose, 1 Process · 6 (250 WPH) Transfer Robot arms: 1 Carrier, 2 Multi-purpose, 3 Process · Stainless Exhaust Lines below Track · SECS1, SECS11, HMDS & GEM Interface required is iUSC · E87/GJG compliance · 2 Piece Wafer Block · Stack 1: No Process Modules – only HMDS Bubblers · Stack 2: No Process Modules – only HMDS Bubblers · Stack 3: 12 CADH modules (no spin modules) · Stack 4: 3 BCT Cups with 10 Nozzles · Stack 5: 3 BCT Cups with 10 Nozzles · AC Power Box with Noise filter: CE Mark Type · AC Power Box 208volts, 3-phase, star, 50/60Hz compatible, SCCR requirements Cassette Block (CSB) · (5) FOUP Loadports (with N2 purge Pre-plumbing) · Carrier RFID capability on CSB · CSB Pressure Sensor Main Block with 5 Process Stacks · Stack 1 & 2 No Process Modules or Robotic Arms o 12 HMDS Bubbler System · Stack 3 HMDS Processing Only o 1 Process Robotic Arm · Stack 4 BARC Processing o (4) BCT Modules with TCT style cups and backside rinse nozzles o (10) 1.2 mm Resist nozzles, (1) SRRC nozzle with Temp control per layer o (10) 0.8 mm Resist nozzles, (1) ARRC nozzle with Temp control per layer o (10) 3ml CRD resist dispense pumps o (10) 3ml ACRD resist dispense pumps o (10) Single Bottle Resist Supply Configuration o EBR angle adjustment capability o Bulk-FSI system for solvent dispense o Exhaust Pressure Control (EPC) per stack o Exhaust duct and drain case cleaning function o Exhaust Thermo Controller System in STHC o 4 Dispense Detection Systems (all COT modules) o Bevel Rinse nozzle (Ver 2) o IFF-S for RRC lines with ARRC-s o IFF-R (for Resist) · Stack 5 BARC Processing o (4) BCT Modules with TCT style cups and backside rinse nozzles o (10) 1.2 mm Resist nozzles, (1) SRRC nozzle with Temp control per layer o (10) 0.8 mm Resist nozzles, (1) ARRC nozzle with Temp control per layer o (10) 3ml CRD resist dispense pumps o (10) 3ml ACRD resist dispense pumps o (10) Single Bottle Resist Supply Configuration o EBR angle adjustment capability o Bulk-FSI system for solvent dispense o Exhaust Pressure Control (EPC) per stack o Exhaust duct and drain case cleaning function o Exhaust Thermo Controller System in STHC o 4 Dispense Detection Systems (all COT modules) o Bevel Rinse nozzle (Ver 2) o IFF-S for RRC lines with ARRC-s o IFF-R (for Resist) · (12) Chilling Adhesion Processing Station (CADH) o Wafer Wedging function using Plate Temperature sensor SW calculation o (2) Bubbler Type HMDS Tank located in Main processing block o Gap Pin type UPIMOL proximity pins on chilling arm · (6) Slim Chill Plate Process Station (SCPL) o Wafer wedging function using vacuum detection sensor o Gap Pin type UPIMOL proximity pins on chilling arm · (2) Chilling High Precision Hot Plate Process Station (CHCH) o Heated Exhaust Chamber o Wafer Wedging function using Plate Temperature sensor SW o Gap Pin type ceramic proximity pins on chilling arm · (14) General Purpose Hot Plate Process Station (CGCH) o Heated Exhaust Chamber o Wafer Wedging function using Plate Temperature sensor SW o Gap Pin type UPIMOL proximity pins on chilling arm · (1) TEL System Temp and Humidity Controller (STHC) o (1) Shinwa unit for system environment control, chemical temperature control and CPL temperature control o (1) Return Air Box - Plenum · (2) New Style Chemical Cabinets o (1) HMDS Canister (3 gallons with gauge) o (1) 3-Pump Solvent chemical supply system o (1) 2-Pump Developer chemical supply system o (1) Sub operation panel o Top side facility connection o CRF for solvent based PCS · (1) New Style AC Power Box o Dual Feed facility supply power with 2 separate breakers o Top side facility connection o Ring type GND connection
    OEM 모델 설명
    CLEAN TRACK™ LITHIUS Pro™ V incorporates all of the advanced technology of the proven CLEAN TRACK™ LITHIUS Pro™ V. It enables higher throughput, increases wafers per day, and improves overall equipment efficiency. Additionally, it also meets industry requirements for versatile lithography equipment capable of leading edge processes, including double patterning.
    문서

    문서 없음

    유사 등재물
    모두 보기
    TEL / TOKYO ELECTRON LITHIUS Pro V

    TEL / TOKYO ELECTRON

    LITHIUS Pro V

    Coaters & Developers빈티지: 0조건: 중고마지막 검증일:어제
    TEL / TOKYO ELECTRON LITHIUS Pro V

    TEL / TOKYO ELECTRON

    LITHIUS Pro V

    Coaters & Developers빈티지: 0조건: 중고마지막 검증일:2일 전
    TEL / TOKYO ELECTRON LITHIUS Pro V

    TEL / TOKYO ELECTRON

    LITHIUS Pro V

    Coaters & Developers빈티지: 0조건: 중고마지막 검증일:60일 이상 전