설명
Missing 1-2 circuit boards and the fork of the transfer robot head; other parts appear to be complete.환경 설정
Part：554804 Length*Width*Height m- 1.3*1.2*1.95OEM 모델 설명
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.문서
문서 없음
유사 등재물
모두 보기
KLA
AIT II
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Parts Tool
작동 상태:
알 수 없음
제품 ID:
114112
웨이퍼 사이즈:
알 수 없음
빈티지:
2001
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Missing 1-2 circuit boards and the fork of the transfer robot head; other parts appear to be complete.환경 설정
Part：554804 Length*Width*Height m- 1.3*1.2*1.95OEM 모델 설명
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.문서
문서 없음