설명
Particle Counter환경 설정
- Wafer holder / configure : 4,6,8 inch - Chuck size : 3.7inch - S/W version : PC - Windows XP Candela Wafer Version - 6.8 Build 6 Wafer Handler Version - 230 - Laser Spec : Optical Head Assembly - Wavelength 405nm / Maximum power output 25mW Wafer Surface Detector - - Wavelength 655nm / Maximum power output 10mW Cassette Mapping Sensor - - Wavelength 670nm / Maximum power output 5mWOEM 모델 설명
The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).문서
카테고리
Defect Inspection
마지막 검증일: 11일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
131288
웨이퍼 사이즈:
4"/100mm, 6"/150mm, 8"/200mm
빈티지:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
KLA
CANDELA CS20
카테고리
Defect Inspection
마지막 검증일: 11일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
131288
웨이퍼 사이즈:
4"/100mm, 6"/150mm, 8"/200mm
빈티지:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available