설명
Patterned / Unpatterned: patterened SECS/GEM: Yes환경 설정
KLA SURFSCAN 7700 - Defect inspection system Dimensions & weight estimates: Mainframe dim (cm): 135 x 95 x 172 Mainframe weight (kg): 1000OEM 모델 설명
Surfscan 7700 is an in-line equipment that monitors contamination on all types of devices with an optimal sensitivity of 0.15 micron. It can detect contaminants below 0.20 micron on complex process levels and multiple systems can be correlated using the same inspection recipes. It also has a microscope review option for on-line classification of contaminants.문서
문서 없음
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
132898
웨이퍼 사이즈:
6"/150mm
빈티지:
1996
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
KLA
SURFSCAN 7700
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
132898
웨이퍼 사이즈:
6"/150mm
빈티지:
1996
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Patterned / Unpatterned: patterened SECS/GEM: Yes환경 설정
KLA SURFSCAN 7700 - Defect inspection system Dimensions & weight estimates: Mainframe dim (cm): 135 x 95 x 172 Mainframe weight (kg): 1000OEM 모델 설명
Surfscan 7700 is an in-line equipment that monitors contamination on all types of devices with an optimal sensitivity of 0.15 micron. It can detect contaminants below 0.20 micron on complex process levels and multiple systems can be correlated using the same inspection recipes. It also has a microscope review option for on-line classification of contaminants.문서
문서 없음