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설명
Automatic Surface Inspection System Other Information : ›Vaccum: 6mm (0.25 in.) line – 500mm (20 in.) of Hg / flow rate 0.24 l/s ›Ducted Venting: two 100mm (4 in.) exhaust hoses ›Power: 200-240V, 50/60 Hz, 2kVA Environment: ≥Class 10 Power Requirements : 200-240 V 50 Hz Weight : 728 lb (330 kg)환경 설정
환경 설정 없음OEM 모델 설명
The Surfscan 6420 detects submicron defects on metal films and rough surfaces but still provides sensitivity down to 0.1 micron on polished silicon. It is effective for detecting defects on non-uniform films, a critical requirement for CMP applications.문서
문서 없음
PREFERRED
SELLER
카테고리
Defect Inspection
마지막 검증일: 어제
Buyer pays 12% premium of final sale price
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
124117
웨이퍼 사이즈:
알 수 없음
빈티지:
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
PREFERRED
SELLER
KLA
SURFSCAN 6420
카테고리
Defect Inspection
마지막 검증일: 어제
Buyer pays 12% premium of final sale price
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
124117
웨이퍼 사이즈:
알 수 없음
빈티지:
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Automatic Surface Inspection System Other Information : ›Vaccum: 6mm (0.25 in.) line – 500mm (20 in.) of Hg / flow rate 0.24 l/s ›Ducted Venting: two 100mm (4 in.) exhaust hoses ›Power: 200-240V, 50/60 Hz, 2kVA Environment: ≥Class 10 Power Requirements : 200-240 V 50 Hz Weight : 728 lb (330 kg)환경 설정
환경 설정 없음OEM 모델 설명
The Surfscan 6420 detects submicron defects on metal films and rough surfaces but still provides sensitivity down to 0.1 micron on polished silicon. It is effective for detecting defects on non-uniform films, a critical requirement for CMP applications.문서
문서 없음