설명
De-installed환경 설정
-Electric source: 208V/1Ph/16A -Non-patterned wafer film surface analyzer -One automatic wafer handler -Defect map and histogram with zoom -2D signal integration -Non-contaminating robotic handler -X-Y Coordinates Software -Random access sender/receiver unitOEM 모델 설명
The Surfscan 6420 detects submicron defects on metal films and rough surfaces but still provides sensitivity down to 0.1 micron on polished silicon. It is effective for detecting defects on non-uniform films, a critical requirement for CMP applications.문서
KLA
SURFSCAN 6420
검증됨
카테고리
Defect Inspection
마지막 검증일: 19일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
102947
웨이퍼 사이즈:
6"/150mm
빈티지:
1998
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
KLA
SURFSCAN 6420
카테고리
Defect Inspection
마지막 검증일: 19일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
102947
웨이퍼 사이즈:
6"/150mm
빈티지:
1998
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available