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Wafer defect detection환경 설정
환경 설정 없음OEM 모델 설명
The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.문서
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KLA
2135
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
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제품 ID:
110360
웨이퍼 사이즈:
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빈티지:
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설명
Wafer defect detection환경 설정
환경 설정 없음OEM 모델 설명
The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.문서
문서 없음