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KLA 2135
    설명
    설명 없음
    환경 설정
    MS-DOS
    OEM 모델 설명
    The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.
    문서

    문서 없음

    KLA

    2135

    verified-listing-icon

    검증됨

    카테고리
    Defect Inspection

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Refurbished


    작동 상태:

    알 수 없음


    제품 ID:

    89654


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA 2135

    KLA

    2135

    Defect Inspection
    빈티지: 1997조건: 중고
    마지막 검증일60일 이상 전

    KLA

    2135

    verified-listing-icon
    검증됨
    카테고리
    Defect Inspection
    마지막 검증일: 60일 이상 전
    listing-photo-aa147c16af764420b0c7b668a25c1d72-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Refurbished


    작동 상태:

    알 수 없음


    제품 ID:

    89654


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    MS-DOS
    OEM 모델 설명
    The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA 2135

    KLA

    2135

    Defect Inspection빈티지: 1997조건: 중고마지막 검증일:60일 이상 전
    KLA 2135

    KLA

    2135

    Defect Inspection빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    KLA 2135

    KLA

    2135

    Defect Inspection빈티지: 0조건: 중고마지막 검증일:60일 이상 전