설명
KLA 2138 YDD Bright Field Inspection Asset Description PTE0005 Software Version KLA2138 CIM SEC Process DEFECT System Type Description Quantity Factory Interface SMIF 2 Options System Others Handler System STAGE Main System Main body Excluded Items List (Pumps, Chillers & Abatement are all excluded)환경 설정
환경 설정 없음OEM 모델 설명
The KLA-2138 is an inline wafer inspection system that uses ultra-broadband technology to detect a wide range of yield-relevant defects on all process layers at high speeds. It features improved brightfield optics, Segmented Auto Threshold technology, and an ultra-broadband illumination source for increased sensitivity and faster setup times. An integrated SMIF minienvironment is also available to streamline automation and reduce fab cleanliness requirements.문서
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KLA
2138
카테고리
Defect Inspection
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
137873
웨이퍼 사이즈:
8"/200mm
빈티지:
1999
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available