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METROLOGY환경 설정
환경 설정 없음OEM 모델 설명
The eDR-7100, an electron-beam wafer defect review and classification system that utilizes a fourth-generation immersion column and an advanced stage to quickly and accurately re-locate, image and classify yield-critical defects.문서
문서 없음
KLA
eDR-7100
카테고리
Defect Inspection
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
123639
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
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설명
METROLOGY환경 설정
환경 설정 없음OEM 모델 설명
The eDR-7100, an electron-beam wafer defect review and classification system that utilizes a fourth-generation immersion column and an advanced stage to quickly and accurately re-locate, image and classify yield-critical defects.문서
문서 없음