설명
58173F LED Testing System환경 설정
Measuring instrumentsOEM 모델 설명
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.문서
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CHROMA
58173
카테고리
Electronic Test
마지막 검증일: 13일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
149651
웨이퍼 사이즈:
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빈티지:
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Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
58173F LED Testing System환경 설정
Measuring instrumentsOEM 모델 설명
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.문서
문서 없음