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ADVANTEST T5377
    설명
    Memory Tester
    환경 설정
    Memory Tester
    OEM 모델 설명
    The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.
    문서

    문서 없음

    ADVANTEST

    T5377

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    검증됨

    카테고리

    Final Test
    마지막 검증일: 60일 이상 전
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    90935


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2004

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    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    ADVANTEST T5377
    ADVANTESTT5377Final Test
    빈티지: 2003조건: 중고
    마지막 검증일60일 이상 전

    ADVANTEST

    T5377

    verified-listing-icon

    검증됨

    카테고리

    Final Test
    마지막 검증일: 60일 이상 전
    listing-photo-44803270a3ba41c1851d4f1ccbe1210f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    90935


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2004


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Memory Tester
    환경 설정
    Memory Tester
    OEM 모델 설명
    The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.
    문서

    문서 없음

    유사 등재물
    모두 보기
    ADVANTEST T5377
    ADVANTEST
    T5377
    Final Test빈티지: 2003조건: 중고마지막 검증일: 60일 이상 전
    ADVANTEST T5377
    ADVANTEST
    T5377
    Final Test빈티지: 0조건: 중고마지막 검증일: 60일 이상 전
    ADVANTEST T5377
    ADVANTEST
    T5377
    Final Test빈티지: 2004조건: 중고마지막 검증일: 60일 이상 전