설명
HDD & Software Included환경 설정
Process: Memory Tester Config: Main, T/H x2, W/S(Blade150), M/B (H7-0760X''XX'') Board(per T/H): DR 2048CH, IO 1028CH, DC 64CH, PPS 256CH, FMRA(BGD-030184/8G) x16, MRA4 RCPU x8 (A-D, E-H)OEM 모델 설명
The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.문서
문서 없음
ADVANTEST
T5377
검증됨
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
80118
웨이퍼 사이즈:
알 수 없음
빈티지:
2003
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
ADVANTEST
T5377
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
80118
웨이퍼 사이즈:
알 수 없음
빈티지:
2003
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
HDD & Software Included환경 설정
Process: Memory Tester Config: Main, T/H x2, W/S(Blade150), M/B (H7-0760X''XX'') Board(per T/H): DR 2048CH, IO 1028CH, DC 64CH, PPS 256CH, FMRA(BGD-030184/8G) x16, MRA4 RCPU x8 (A-D, E-H)OEM 모델 설명
The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.문서
문서 없음