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ADVANTEST T5833
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    설명 없음
    환경 설정
    Diag/Cal/TH Cart Access Kit
    OEM 모델 설명
    The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.
    문서

    문서 없음

    verified-listing-icon

    검증됨

    카테고리
    Final Test

    마지막 검증일: 5일 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    150753


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2005


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    ADVANTEST T5833

    ADVANTEST

    T5833

    Final Test
    빈티지: 0조건: 중고
    마지막 검증일60일 이상 전

    ADVANTEST

    T5833

    verified-listing-icon
    검증됨
    카테고리
    Final Test
    마지막 검증일: 5일 전
    listing-photo-4bdcf977c1184de58e4d718471b49a41-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    150753


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2005


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    Diag/Cal/TH Cart Access Kit
    OEM 모델 설명
    The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.
    문서

    문서 없음

    유사 등재물
    모두 보기
    ADVANTEST T5833

    ADVANTEST

    T5833

    Final Test빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    ADVANTEST T5833

    ADVANTEST

    T5833

    Final Test빈티지: 2005조건: 중고마지막 검증일:5일 전
    ADVANTEST T5833

    ADVANTEST

    T5833

    Final Test빈티지: 2019조건: 중고마지막 검증일:60일 이상 전