설명
PROPERTY Version-2.0 SYSTEM INFORMATION Product Type-T5833 Power Frequency-60 PStype- THtype-QSTH MBtype-NORMAL SYS-Ctype-STANDARD RCPUcount-0 FMfunction- STANDARD FmECC-DISABLE FmHSFbmap- DISABLE환경 설정
환경 설정 없음OEM 모델 설명
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.문서
문서 없음
ADVANTEST
T5833
검증됨
카테고리
Final Test
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
102948
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ADVANTEST
T5833
검증됨
카테고리
Final Test
마지막 검증일: 17일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
102948
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
PROPERTY Version-2.0 SYSTEM INFORMATION Product Type-T5833 Power Frequency-60 PStype- THtype-QSTH MBtype-NORMAL SYS-Ctype-STANDARD RCPUcount-0 FMfunction- STANDARD FmECC-DISABLE FmHSFbmap- DISABLE환경 설정
환경 설정 없음OEM 모델 설명
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.문서
문서 없음