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설명
Advantest B6700D Memory Burn-In Test System, 200/208V, 3ph, 50/60Hz, 48-board capacity, 4ea WUN-B6700C racks, Hitachi HF-W2000 control computer. Mfg 2019. 134in x 68in x 92in H.환경 설정
환경 설정 없음OEM 모델 설명
B6700D uses a high-capacity power supply that delivers a maximum of 256 amps per burn-in board - twice that of the first-generation B6700 tester. In addition, it has twice the driver pin resources as its predecessor, enabling it to reach higher testing frequencies and efficiency. It can also maintain or increase parallelism to keep throughput high as the number of stacked NAND die per package increases in the future. Additionally, the B6700D's oven can replicate operating conditions while controlling temperature in 0.1 ℃ increments.문서
문서 없음
ADVANTEST
B6700D
카테고리
Final Test
마지막 검증일: 14일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
124147
웨이퍼 사이즈:
알 수 없음
빈티지:
2019
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설명
Advantest B6700D Memory Burn-In Test System, 200/208V, 3ph, 50/60Hz, 48-board capacity, 4ea WUN-B6700C racks, Hitachi HF-W2000 control computer. Mfg 2019. 134in x 68in x 92in H.환경 설정
환경 설정 없음OEM 모델 설명
B6700D uses a high-capacity power supply that delivers a maximum of 256 amps per burn-in board - twice that of the first-generation B6700 tester. In addition, it has twice the driver pin resources as its predecessor, enabling it to reach higher testing frequencies and efficiency. It can also maintain or increase parallelism to keep throughput high as the number of stacked NAND die per package increases in the future. Additionally, the B6700D's oven can replicate operating conditions while controlling temperature in 0.1 ℃ increments.문서
문서 없음