설명
Memory Burn-in Tester B6700S환경 설정
B6700S_01OEM 모델 설명
B6700S system offers a dramatically lower-cost test solution for NAND flash memories while offering the same capabilities as its sister systems. The B6700S offers a unitized function of the B6700D and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.문서
문서 없음
ADVANTEST
B6700S
검증됨
카테고리
Final Test
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
102494
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ADVANTEST
B6700S
검증됨
카테고리
Final Test
마지막 검증일: 21일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
102494
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Memory Burn-in Tester B6700S환경 설정
B6700S_01OEM 모델 설명
B6700S system offers a dramatically lower-cost test solution for NAND flash memories while offering the same capabilities as its sister systems. The B6700S offers a unitized function of the B6700D and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.문서
문서 없음