설명
Epi Metrology & Testers환경 설정
Software Version: Carmel Version 2015.3.8300 / Lynx Version 2.15.3.8300 Lasers: 355nm and 405nm Process: Photoluminescence on InGaN or AlInGaP LED wafers Spare Parts: Potentially some available PL SystemOEM 모델 설명
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.문서
문서 없음
카테고리
Metrology
마지막 검증일: 17일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
134527
웨이퍼 사이즈:
6"/150mm
빈티지:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
IMPERIA
카테고리
Metrology
마지막 검증일: 17일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
134527
웨이퍼 사이즈:
6"/150mm
빈티지:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Epi Metrology & Testers환경 설정
Software Version: Carmel Version 2015.3.8300 / Lynx Version 2.15.3.8300 Lasers: 355nm and 405nm Process: Photoluminescence on InGaN or AlInGaP LED wafers Spare Parts: Potentially some available PL SystemOEM 모델 설명
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.문서
문서 없음