메인 콘텐츠로 건너뛰기
Moov logo

Moov Icon
KLA FLX 2320
    설명
    Stress Measurement TDCS
    환경 설정
    Thin film stress measure
    OEM 모델 설명
    The Tencor FLX-2320 is an equipment that accurately measures film stress at temperatures from -65°C to 500°C, using dual wavelength technology to work on all types of films, including transparent ones like silicon nitride. This helps better understand film properties in simulated process environments.
    문서

    문서 없음

    KLA

    FLX 2320

    verified-listing-icon

    검증됨

    카테고리
    Metrology

    마지막 검증일: 30일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    Installed / Idle


    제품 ID:

    93187


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2000

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA FLX 2320

    KLA

    FLX 2320

    Metrology
    빈티지: 1992조건: 중고
    마지막 검증일60일 이상 전

    KLA

    FLX 2320

    verified-listing-icon
    검증됨
    카테고리
    Metrology
    마지막 검증일: 30일 이상 전
    listing-photo-70bbb97f5d4e4212b001c5ce11597236-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/70bbb97f5d4e4212b001c5ce11597236/2339566eaad64bb2b46dcb30d4cb99cb_be5471a7adf2451c98b3faf25bffc5911201a_mw.jpeg
    listing-photo-70bbb97f5d4e4212b001c5ce11597236-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/70bbb97f5d4e4212b001c5ce11597236/68e04aabc2c84fb8acd38e369209c834_8c92b5ba79004de8acc731c4aedfa6bc1201a_mw.jpeg
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    Installed / Idle


    제품 ID:

    93187


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2000


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Stress Measurement TDCS
    환경 설정
    Thin film stress measure
    OEM 모델 설명
    The Tencor FLX-2320 is an equipment that accurately measures film stress at temperatures from -65°C to 500°C, using dual wavelength technology to work on all types of films, including transparent ones like silicon nitride. This helps better understand film properties in simulated process environments.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA FLX 2320

    KLA

    FLX 2320

    Metrology빈티지: 1992조건: 중고마지막 검증일: 60일 이상 전
    KLA FLX 2320

    KLA

    FLX 2320

    Metrology빈티지: 1993조건: 중고마지막 검증일: 10일 전