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KOBELCO / LEO LTA 700
    설명
    Wafer Lifetime Mesurement System
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.
    문서

    문서 없음

    KOBELCO / LEO

    LTA 700

    verified-listing-icon

    검증됨

    카테고리
    Metrology

    마지막 검증일: 30일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    115092


    웨이퍼 사이즈:

    6"/150mm


    빈티지:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KOBELCO / LEO LTA 700

    KOBELCO / LEO

    LTA 700

    Metrology
    빈티지: 1997조건: 중고
    마지막 검증일30일 이상 전

    KOBELCO / LEO

    LTA 700

    verified-listing-icon
    검증됨
    카테고리
    Metrology
    마지막 검증일: 30일 이상 전
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/b239050e45e341d18aa4e32aba9b4812_1_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/a3b504f56c2d4fb88049bfd15a6c02c0_2_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/9d9421b46e8c4fc4afa008a844b24da5_3_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61f1cc918d2b44569d801ed69261bb47_4_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/5e528d6f8bf94c6c8b3b368ff85bfc7b_5_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/c294cb1c75534416b51abf1c04237488_6_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61cf7ad28bd9451f830f20504beea2ff_7_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/70e6c6972f8f43939b979e81298a41b6_8_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61d9742724ae4ad78c0f9a56ff055ade_9_mw.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    115092


    웨이퍼 사이즈:

    6"/150mm


    빈티지:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Wafer Lifetime Mesurement System
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KOBELCO / LEO LTA 700

    KOBELCO / LEO

    LTA 700

    Metrology빈티지: 1997조건: 중고마지막 검증일:30일 이상 전
    KOBELCO / LEO LTA 700

    KOBELCO / LEO

    LTA 700

    Metrology빈티지: 1997조건: 중고마지막 검증일:60일 이상 전