설명
Wafer / Reticle inspection .15um particle detection / bare silicon환경 설정
Wafer / Reticle scanner 100mm - 200mm .15 um particle detection / newOEM 모델 설명
The SDM-100xy is a dark-field laser surface defect monitor capable of scanning 150mm–200mm silicon wafers, reticles, photomasks, and glass substrates. Scanning the glass side of a reticle is within capability with minor modifications; pellicle scanning feasibility can be tested. All non-silicon materials require a specific calibration to ensure accurate defect size classification.문서
문서 없음
카테고리
Metrology
마지막 검증일: 3일 전
주요 품목 세부 정보
조건:
New
작동 상태:
Installed / Running
제품 ID:
153188
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
SILVER SAGE PRECISION
SDMxy100
카테고리
Metrology
마지막 검증일: 3일 전
주요 품목 세부 정보
조건:
New
작동 상태:
Installed / Running
제품 ID:
153188
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Wafer / Reticle inspection .15um particle detection / bare silicon환경 설정
Wafer / Reticle scanner 100mm - 200mm .15 um particle detection / newOEM 모델 설명
The SDM-100xy is a dark-field laser surface defect monitor capable of scanning 150mm–200mm silicon wafers, reticles, photomasks, and glass substrates. Scanning the glass side of a reticle is within capability with minor modifications; pellicle scanning feasibility can be tested. All non-silicon materials require a specific calibration to ensure accurate defect size classification.문서
문서 없음