설명
metallographic microscope환경 설정
1. Eyepiece: SWN 10X 2. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole manual nose wheel 4. Upper light source lamp house 5. Bright and dark vision body, objective lens: 5XBD , 10XBD , 20XBD , 50XBD 6. CCD adapter mirror 7. Mobile bed: 6X6 STAGEOEM 모델 설명
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.문서
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NIKON
OPTIPHOT 150
검증됨
카테고리
Microscope
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
74560
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
NIKON
OPTIPHOT 150
카테고리
Microscope
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
74560
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
metallographic microscope환경 설정
1. Eyepiece: SWN 10X 2. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole manual nose wheel 4. Upper light source lamp house 5. Bright and dark vision body, objective lens: 5XBD , 10XBD , 20XBD , 50XBD 6. CCD adapter mirror 7. Mobile bed: 6X6 STAGEOEM 모델 설명
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.문서
문서 없음