설명
설명 없음환경 설정
1. Eyepiece: SWN 10X 2. Observer barrel: Three-eye observer barrel 3. Nasal ring: 5-hole manual nostril 4. Light house 5. Light and dark field body, object mirror: 5XBD,10XBD ,20XBD , 50XBD , 100BD 6. CCD transfer mirror 7. Mobile bed: 6X6 STAGEOEM 모델 설명
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.문서
문서 없음
NIKON
OPTIPHOT 150
검증됨
카테고리
Microscope
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
47557
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
NIKON
OPTIPHOT 150
카테고리
Microscope
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
47557
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
1. Eyepiece: SWN 10X 2. Observer barrel: Three-eye observer barrel 3. Nasal ring: 5-hole manual nostril 4. Light house 5. Light and dark field body, object mirror: 5XBD,10XBD ,20XBD , 50XBD , 100BD 6. CCD transfer mirror 7. Mobile bed: 6X6 STAGEOEM 모델 설명
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.문서
문서 없음