설명
설명 없음환경 설정
ResMap Four Point Probe Manual load “baby” Wafer size: 2”-8” Manual load Max round sample: 8.2” φ , Max square sample:5.8”x5.8” Maximum throughput: 1min/wafer, (49pints) MeasurementRange - 1m to 10M Accuracy 0.5% 0.02% static, 0.1% dynamic Measurement unit size: 12”W x 10”H x 18”D Full functional unit Included: Measurement unit, computer, Keyboard/mouse,monitor.OEM 모델 설명
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).문서
문서 없음
CDE
ResMap 178
검증됨
카테고리
Resistivity / Four Point Probe
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
68125
웨이퍼 사이즈:
2"/50mm, 4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
CDE
ResMap 178
카테고리
Resistivity / Four Point Probe
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
68125
웨이퍼 사이즈:
2"/50mm, 4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
ResMap Four Point Probe Manual load “baby” Wafer size: 2”-8” Manual load Max round sample: 8.2” φ , Max square sample:5.8”x5.8” Maximum throughput: 1min/wafer, (49pints) MeasurementRange - 1m to 10M Accuracy 0.5% 0.02% static, 0.1% dynamic Measurement unit size: 12”W x 10”H x 18”D Full functional unit Included: Measurement unit, computer, Keyboard/mouse,monitor.OEM 모델 설명
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).문서
문서 없음