설명
Four Point Probe Feature: Manual load “baby” Wafer size: 2”-8” Manual load Max round sample: 8.2” φ , Max square sample:5.8”x5.8” Maximum throughput: 1min/wafer, (49pints) MeasurementRange 1mΩ/☐ to 10MΩ/☐ Accuracy 0.5% Repeatability 0.02% static, 0.1% dynamic Repeatability Measurement unit size: 12”W x 10”H x 18”D환경 설정
환경 설정 없음OEM 모델 설명
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).문서
문서 없음
카테고리
Resistivity / Four Point Probe
마지막 검증일: 4일 전
주요 품목 세부 정보
조건:
Refurbished
작동 상태:
알 수 없음
제품 ID:
138655
웨이퍼 사이즈:
2"/50mm, 8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
CDE
ResMap 178
카테고리
Resistivity / Four Point Probe
마지막 검증일: 4일 전
주요 품목 세부 정보
조건:
Refurbished
작동 상태:
알 수 없음
제품 ID:
138655
웨이퍼 사이즈:
2"/50mm, 8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Four Point Probe Feature: Manual load “baby” Wafer size: 2”-8” Manual load Max round sample: 8.2” φ , Max square sample:5.8”x5.8” Maximum throughput: 1min/wafer, (49pints) MeasurementRange 1mΩ/☐ to 10MΩ/☐ Accuracy 0.5% Repeatability 0.02% static, 0.1% dynamic Repeatability Measurement unit size: 12”W x 10”H x 18”D환경 설정
환경 설정 없음OEM 모델 설명
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).문서
문서 없음