설명
설명 없음환경 설정
FEI Helios 600 Upgrade Ion NanoLab 600) Systems: Helios Nanolab 600 FEI Company Helios NanoLab 600 Dual Beam Electron Microscope The core instrument includes: Dedicated microscope controller with FEI Company XT software version 3.X.X Support Computer with Windows 7 2x 24" Widescreen LCD Monitors Dual Desktop Column (dedicated Elstar FEG tips) 21nA current Sidewinder Ion Column View Lens, Supersoot, & Extractor Ultra High Resolution 5 axis stage In-lens Detector (TLD) and SE and BSED modes (New TLD) Secondary Electron Detector (SED) Oil Free Pumping System Accessories: System Accessories Included CDM Detector Accessories: GIS Chemistry Included one Metal Deposition Chemistry (Pt, W) Pump Edwards nXDS10 Included - one nXDS10 100-127 V, 200-240 V, 1ph 50/60 Hz Air Cooled Water Chiller Included - one new Air Cooled Water Chiller Accessories: Omniprobe 200 Included - one Oxford Instruments Omniprobe 200 Accessories: System Accessories Included one ONEAC TransformerOEM 모델 설명
The Helios NanoLab 600 is a Dual Beam FIB/SEM (Focused Ion Beam/Scanning Electron Microscope) that is designed for high-end imaging during failure analysis. It features an extreme high-resolution column, a fine-probe ion source, and a 150 x 150 mm, five-axis, XY piezo stage. This makes it a smart investment for failure-analysis labs that require versatile sample handling, from packaged parts to eight-inch wafers. The Helios NanoLab 600 is particularly useful for cross-sectioning samples and delivers three-dimensional imaging, allowing you to quickly and efficiently locate and view device features from different angles. Additionally, patented beam chemistries can be used to highlight interface layers for imaging in the system, providing you with the most accurate data possible without additional preparation steps outside the system.문서
문서 없음
카테고리
SEM / FIB
마지막 검증일: 15일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
150315
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
HELIOS NANOLAB 600
카테고리
SEM / FIB
마지막 검증일: 15일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
150315
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
FEI Helios 600 Upgrade Ion NanoLab 600) Systems: Helios Nanolab 600 FEI Company Helios NanoLab 600 Dual Beam Electron Microscope The core instrument includes: Dedicated microscope controller with FEI Company XT software version 3.X.X Support Computer with Windows 7 2x 24" Widescreen LCD Monitors Dual Desktop Column (dedicated Elstar FEG tips) 21nA current Sidewinder Ion Column View Lens, Supersoot, & Extractor Ultra High Resolution 5 axis stage In-lens Detector (TLD) and SE and BSED modes (New TLD) Secondary Electron Detector (SED) Oil Free Pumping System Accessories: System Accessories Included CDM Detector Accessories: GIS Chemistry Included one Metal Deposition Chemistry (Pt, W) Pump Edwards nXDS10 Included - one nXDS10 100-127 V, 200-240 V, 1ph 50/60 Hz Air Cooled Water Chiller Included - one new Air Cooled Water Chiller Accessories: Omniprobe 200 Included - one Oxford Instruments Omniprobe 200 Accessories: System Accessories Included one ONEAC TransformerOEM 모델 설명
The Helios NanoLab 600 is a Dual Beam FIB/SEM (Focused Ion Beam/Scanning Electron Microscope) that is designed for high-end imaging during failure analysis. It features an extreme high-resolution column, a fine-probe ion source, and a 150 x 150 mm, five-axis, XY piezo stage. This makes it a smart investment for failure-analysis labs that require versatile sample handling, from packaged parts to eight-inch wafers. The Helios NanoLab 600 is particularly useful for cross-sectioning samples and delivers three-dimensional imaging, allowing you to quickly and efficiently locate and view device features from different angles. Additionally, patented beam chemistries can be used to highlight interface layers for imaging in the system, providing you with the most accurate data possible without additional preparation steps outside the system.문서
문서 없음