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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB
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    OEM 모델 설명
    The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.
    문서

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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

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    검증됨

    카테고리
    SEM / FIB

    마지막 검증일: 25일 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    117575


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    SEM / FIB
    빈티지: 0조건: 중고
    마지막 검증일25일 전

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    verified-listing-icon
    검증됨
    카테고리
    SEM / FIB
    마지막 검증일: 25일 전
    listing-photo-f33c93bbfeb5457b826a338b7cddd298-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    117575


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.
    문서

    문서 없음

    유사 등재물
    모두 보기
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    SEM / FIB빈티지: 0조건: 중고마지막 검증일:25일 전
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    NOVA 200 NANOLAB

    SEM / FIB빈티지: 0조건: 중고마지막 검증일:60일 이상 전