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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB
  • THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB
  • THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB
  • THERMOFISHER SCIENTIFIC / FEI / PHILLIPS NOVA 200 NANOLAB
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환경 설정
환경 설정 없음
OEM 모델 설명
The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.
문서

문서 없음

카테고리
SEM / FIB

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

117575


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

NOVA 200 NANOLAB

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검증됨
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
listing-photo-f33c93bbfeb5457b826a338b7cddd298-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

117575


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음
환경 설정
환경 설정 없음
OEM 모델 설명
The FEI Nova NanoLab 200 is a powerful tool for researchers and developers working with complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch and deposition to provide advanced capabilities and flexibility. This tool complements existing nanotechnology laboratory tools and extends the range of applications for nanoscale prototyping, machining, 2D and 3D-characterization, and analysis.
문서

문서 없음