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ANALYTICAL EQUIPMENT환경 설정
FA SEMs/TEMs/Dual Beams 200kV dedicated STEM with thermal FE election source Resolution 0.204nm Phase contract image (TE image), Z-contrast image (ZC image), Secondary electron image (SE image)OEM 모델 설명
200 kV dedicated STEM for semiconducting industry, materials science and biological science.문서
문서 없음
HITACHI
HD-2300
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
20309
웨이퍼 사이즈:
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빈티지:
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설명
ANALYTICAL EQUIPMENT환경 설정
FA SEMs/TEMs/Dual Beams 200kV dedicated STEM with thermal FE election source Resolution 0.204nm Phase contract image (TE image), Z-contrast image (ZC image), Secondary electron image (SE image)OEM 모델 설명
200 kV dedicated STEM for semiconducting industry, materials science and biological science.문서
문서 없음