설명
The S-4700 Type I for sale presents an exceptional opportunity for buyers seeking a high-resolution electron microscope. This unit has been meticulously maintained by Hitachi Trained Engineers and has benefited from continuous coverage under a service contract since its original manufacture and installation in the United States.환경 설정
Rotary Pumps x2 Air Compressor HP Computer Keyboard / Mouse Toolbox and toolsOEM 모델 설명
The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.문서
문서 없음
주요 품목 세부 정보
조건:
Used
작동 상태:
Installed / Running
제품 ID:
144526
웨이퍼 사이즈:
알 수 없음
HDD / Software:
Yes
Resolution:
1.5 nm
Electron:
Cold Field Emission
Loadlock:
Type 1 4 Inch
Detectors:
SE detector, Upper and Lower
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
HITACHI
S-4700 I
카테고리
SEM / FIB
마지막 검증일: 13일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Installed / Running
제품 ID:
144526
웨이퍼 사이즈:
알 수 없음
HDD / Software:
Yes
Resolution:
1.5 nm
Electron:
Cold Field Emission
Loadlock:
Type 1 4 Inch
Detectors:
SE detector, Upper and Lower
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
The S-4700 Type I for sale presents an exceptional opportunity for buyers seeking a high-resolution electron microscope. This unit has been meticulously maintained by Hitachi Trained Engineers and has benefited from continuous coverage under a service contract since its original manufacture and installation in the United States.환경 설정
Rotary Pumps x2 Air Compressor HP Computer Keyboard / Mouse Toolbox and toolsOEM 모델 설명
The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.문서
문서 없음