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HITACHI S-4700 II
  • HITACHI S-4700 II
설명
The Hitachi 4700-II ODP is equipped with a cold FEG emitter, high vacuum, Large 100x50mm XY stage, 6” load lock entry, and ODP vacuum.
환경 설정
환경 설정 없음
OEM 모델 설명
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
문서

문서 없음

카테고리
SEM / FIB

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

112331


웨이퍼 사이즈:

6"/150mm


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

HITACHI

S-4700 II

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검증됨
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
listing-photo-e20f81907f1f4407a622ff9d289657b0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43793/e20f81907f1f4407a622ff9d289657b0/848d6bb3186049c2874de6709b1f6d24_1491901918_mw.png
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

112331


웨이퍼 사이즈:

6"/150mm


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
The Hitachi 4700-II ODP is equipped with a cold FEG emitter, high vacuum, Large 100x50mm XY stage, 6” load lock entry, and ODP vacuum.
환경 설정
환경 설정 없음
OEM 모델 설명
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
문서

문서 없음