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HITACHI NB5000
    설명
    Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
    환경 설정
    Resolution: SEM: 1.0 nm at 15 kV FIB: 5 nm at 40 kV FIB Column: Ga Ion source: >50 nA 2-Stage electro static lens system Octopole electro static lens system Pattern generator system: 4K x 4K SEM Column: Maximum beam current: >30 nA 3-Stage electro magnetic lens reduction system Electro static blanking system SE Power supply Image memory: 2560 x 1920 Vacuum system: Turbo molecular pump Dry pump Ion source chamber Electron gun (2) Buffer tanks Micro-sampling system: 3-Axis motor drive system X Range: 1 mm Y Range: 2 mm Z Range: 2.5 mm Chamber scope: LCD Monitor, 7" Stand IR Camera Power cable AC / DC Adaptor Air compressor N2 Gas leak system Multi-stage control panel Console control unit Power supply unit AC Power distribution Transformer Laser sample height adjust tool Manual sample height adjust tool Interlock function PC Processor: INTEL i7 Flat panel LCD Monitor, 22" Mouse Keyboard Control panel RAM: 16 GB Hard Disk Drive (HDD): 500 GB Does not include EDS Operating system: Windows 7, 64-Bit
    OEM 모델 설명
    미제공
    문서

    문서 없음

    verified-listing-icon

    검증됨

    카테고리
    SEM / FIB

    마지막 검증일: 16일 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    138358


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2018


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    HITACHI NB5000

    HITACHI

    NB5000

    SEM / FIB
    빈티지: 2018조건: 중고
    마지막 검증일어제

    HITACHI

    NB5000

    verified-listing-icon
    검증됨
    카테고리
    SEM / FIB
    마지막 검증일: 16일 전
    listing-photo-ea2c6480c17c40ee89e6c837a92baee5-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    138358


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2018


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
    환경 설정
    Resolution: SEM: 1.0 nm at 15 kV FIB: 5 nm at 40 kV FIB Column: Ga Ion source: >50 nA 2-Stage electro static lens system Octopole electro static lens system Pattern generator system: 4K x 4K SEM Column: Maximum beam current: >30 nA 3-Stage electro magnetic lens reduction system Electro static blanking system SE Power supply Image memory: 2560 x 1920 Vacuum system: Turbo molecular pump Dry pump Ion source chamber Electron gun (2) Buffer tanks Micro-sampling system: 3-Axis motor drive system X Range: 1 mm Y Range: 2 mm Z Range: 2.5 mm Chamber scope: LCD Monitor, 7" Stand IR Camera Power cable AC / DC Adaptor Air compressor N2 Gas leak system Multi-stage control panel Console control unit Power supply unit AC Power distribution Transformer Laser sample height adjust tool Manual sample height adjust tool Interlock function PC Processor: INTEL i7 Flat panel LCD Monitor, 22" Mouse Keyboard Control panel RAM: 16 GB Hard Disk Drive (HDD): 500 GB Does not include EDS Operating system: Windows 7, 64-Bit
    OEM 모델 설명
    미제공
    문서

    문서 없음

    유사 등재물
    모두 보기
    HITACHI NB5000

    HITACHI

    NB5000

    SEM / FIB빈티지: 2018조건: 중고마지막 검증일:어제
    HITACHI NB5000

    HITACHI

    NB5000

    SEM / FIB빈티지: 2011조건: 중고마지막 검증일:60일 이상 전
    HITACHI NB5000

    HITACHI

    NB5000

    SEM / FIB빈티지: 2018조건: 중고마지막 검증일:16일 전