설명
ANALYTICAL EQUIPMENT환경 설정
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 axis motorized Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg. Operating System: Windows XP Professional Options: 1. Trackball for stage control 2. TE (STEM) detector 3. Video Amplifier unit 4. Photomultiplier Power Supply 5. Deceleration function 6. Electrostatic beam blanking unit 7. Quartz PCI 8. Chamber camera 9. RS-232C 10. Dry roughing pumpOEM 모델 설명
Field Emission Scanning Electron Microscope문서
문서 없음
HITACHI
S-4800 II
검증됨
카테고리
SEM
주요 품목 세부 정보
조건:
Refurbished
작동 상태:
알 수 없음
제품 ID:
36384
웨이퍼 사이즈:
8"/200mm
빈티지:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
HITACHI
S-4800 II
검증됨
카테고리
SEM
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Refurbished
작동 상태:
알 수 없음
제품 ID:
36384
웨이퍼 사이즈:
8"/200mm
빈티지:
2007
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
ANALYTICAL EQUIPMENT환경 설정
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 axis motorized Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg. Operating System: Windows XP Professional Options: 1. Trackball for stage control 2. TE (STEM) detector 3. Video Amplifier unit 4. Photomultiplier Power Supply 5. Deceleration function 6. Electrostatic beam blanking unit 7. Quartz PCI 8. Chamber camera 9. RS-232C 10. Dry roughing pumpOEM 모델 설명
Field Emission Scanning Electron Microscope문서
문서 없음