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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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ASML TWINSCAN XT:400G
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    OEM 모델 설명
    The TWINSCAN XT:400G 365-nm Step-and-Scan system is an ultra high-productivity, dual-stage lithography tool designed for volume 300-mm wafer production at 350-nm resolution. The dual wafer-stage technology of the TWINSCAN platform enables the exposure of one wafer and the alignment and mapping of the next wafer to take place in parallel, thereby virtually eliminating overhead time and allowing for continuous patterning of wafers.
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    ASML

    TWINSCAN XT:400G

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    검증됨

    카테고리
    Steppers & Scanners

    마지막 검증일: 16일 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    91663


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    ASML TWINSCAN XT:400G

    ASML

    TWINSCAN XT:400G

    Steppers & Scanners
    빈티지: 0조건: 중고
    마지막 검증일16일 전

    ASML

    TWINSCAN XT:400G

    verified-listing-icon
    검증됨
    카테고리
    Steppers & Scanners
    마지막 검증일: 16일 전
    listing-photo-09818909b0b94f79a108631954699fc3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    91663


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    i-Line Scanner
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The TWINSCAN XT:400G 365-nm Step-and-Scan system is an ultra high-productivity, dual-stage lithography tool designed for volume 300-mm wafer production at 350-nm resolution. The dual wafer-stage technology of the TWINSCAN platform enables the exposure of one wafer and the alignment and mapping of the next wafer to take place in parallel, thereby virtually eliminating overhead time and allowing for continuous patterning of wafers.
    문서

    문서 없음

    유사 등재물
    모두 보기
    ASML TWINSCAN XT:400G

    ASML

    TWINSCAN XT:400G

    Steppers & Scanners빈티지: 0조건: 중고마지막 검증일:16일 전