UltraMap-200B
개요
Benchtop automated thickness measurement system with X-Y stage on air bearing for wafers up to 8” round and for square wafers up to 156mmx156mm. Solar Wafers QA and QC, Cost effective, compact metrology tool for R&D labs for all type of wafers and surfaces.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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