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6" Fab For Sale from Moov - Click Here to Learn More
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KLA SpectraCD-XT
    설명
    설명 없음
    환경 설정
    Model: SpectraCD-XTS+ N40~013
    OEM 모델 설명
    In February 2006, KLA introduced the SpectraCD-XT—our fourth-generation of inline optical CD metrology systems for advanced patterning process control at the 90nm and 65nm nodes. SpectraCD-XT is a non-destructive dedicated CD and profile metrology system built on our high-throughput, production-proven Archer platform. The tool is the only high performance spectroscopic ellipsometry (SE)-based
    문서

    문서 없음

    KLA

    SpectraCD-XT

    verified-listing-icon

    검증됨

    카테고리
    Thin Film / Film Thickness

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    14632


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA SpectraCD-XT

    KLA

    SpectraCD-XT

    Thin Film / Film Thickness
    빈티지: 0조건: 중고
    마지막 검증일60일 이상 전

    KLA

    SpectraCD-XT

    verified-listing-icon
    검증됨
    카테고리
    Thin Film / Film Thickness
    마지막 검증일: 60일 이상 전
    listing-photo-B1580su3y8x5voF6EpKuZ9uqvQ-5myxfWsN6KJEfRP4-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    14632


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    Model: SpectraCD-XTS+ N40~013
    OEM 모델 설명
    In February 2006, KLA introduced the SpectraCD-XT—our fourth-generation of inline optical CD metrology systems for advanced patterning process control at the 90nm and 65nm nodes. SpectraCD-XT is a non-destructive dedicated CD and profile metrology system built on our high-throughput, production-proven Archer platform. The tool is the only high performance spectroscopic ellipsometry (SE)-based
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA SpectraCD-XT

    KLA

    SpectraCD-XT

    Thin Film / Film Thickness빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    KLA SpectraCD-XT

    KLA

    SpectraCD-XT

    Thin Film / Film Thickness빈티지: 0조건: 중고마지막 검증일:60일 이상 전