메인 콘텐츠로 건너뛰기
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
KLA UV-1280SE
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Prometrix UV-1280SE is a production thin film measurement system that combines dual-beam spectrophotometry and broadband spectroscopic ellipsometry. It can directly measure film thickness, refractive index, and extinction coefficient of single- and multi-layer thin film stacks simultaneously. The system is easy to use, lowers cost of ownership, and increases production efficiency. It is useful for both process control and advanced materials development.
    문서

    문서 없음

    KLA

    UV-1280SE

    verified-listing-icon

    검증됨

    카테고리
    Thin Film / Film Thickness

    마지막 검증일: 27일 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    98347


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness
    빈티지: 2000조건: 중고
    마지막 검증일60일 이상 전

    KLA

    UV-1280SE

    verified-listing-icon
    검증됨
    카테고리
    Thin Film / Film Thickness
    마지막 검증일: 27일 전
    listing-photo-2196974d8c6747faaa007b8a14fa6671-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    98347


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Prometrix UV-1280SE is a production thin film measurement system that combines dual-beam spectrophotometry and broadband spectroscopic ellipsometry. It can directly measure film thickness, refractive index, and extinction coefficient of single- and multi-layer thin film stacks simultaneously. The system is easy to use, lowers cost of ownership, and increases production efficiency. It is useful for both process control and advanced materials development.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness빈티지: 2000조건: 중고마지막 검증일:60일 이상 전
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness빈티지: 0조건: 중고마지막 검증일:23일 전