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ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
    설명
    Concentration
    환경 설정
    PL Mapping
    OEM 모델 설명
    The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
    문서

    문서 없음

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    verified-listing-icon

    검증됨

    카테고리
    Wet Processing / Wafer Cleaning

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보
    조건:

    Used

    작동 상태:

    알 수 없음

    제품 ID:

    112393

    웨이퍼 사이즈:

    12"/300mm

    빈티지:

    2000

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    Wet Processing / Wafer Cleaning
    빈티지: 2000조건: 중고
    마지막 검증일60일 이상 전
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    Wet Processing / Wafer Cleaning
    빈티지: 2002조건: 중고
    마지막 검증일60일 이상 전

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    verified-listing-icon
    검증됨
    카테고리
    Wet Processing / Wafer Cleaning
    마지막 검증일: 60일 이상 전
    listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/79d5eeaeb42b417eac372c093e698ccc_ce5f29a791a447b3a24333d4eb27a5dd1201a_mw.jpeg
    listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/616d754d2a26498193cf8a43a935355e_18c07cac3f414bf19d4a04b520253c14_mw.jpeg
    listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/ad8a4b9e8ce6424bb7e9b4378ba742a8_6e337e5ff7324e2680f02dbddc1d92a2_mw.jpeg
    listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/53add12bc4f54bffab3aa2214846cb7c_a1a4151c1e2a413694afd4e90f7ce79f_mw.jpeg
    listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/e9c219cb9b0e4474923724dc7ca8e745_65299a9cfa6c473792fe7548b6693f48_mw.jpeg
    listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/8ab6f6ba087341dbb42cdfecfab812b7_f0bda36d8cd84c20966a53ac397def151201a_mw.jpeg
    listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/0c49f68932dc44baa801aef0e0f47666_bbb3fda6fe47402582c5e5f9f07a744f_mw.jpeg
    listing-photo-207d9e254c5140d79506e1700b7d832f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85178/207d9e254c5140d79506e1700b7d832f/f8fa53dea6ca4225ac6e97bb236a86bb_797e8b22fec343498bf4fa281ece09671201a_mw.jpeg
    주요 품목 세부 정보
    조건:

    Used

    작동 상태:

    알 수 없음

    제품 ID:

    112393

    웨이퍼 사이즈:

    12"/300mm

    빈티지:

    2000

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Concentration
    환경 설정
    PL Mapping
    OEM 모델 설명
    The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
    문서

    문서 없음

    유사 등재물
    모두 보기
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    Wet Processing / Wafer Cleaning빈티지: 2000조건: 중고마지막 검증일:60일 이상 전
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    Wet Processing / Wafer Cleaning빈티지: 2002조건: 중고마지막 검증일:60일 이상 전